24 – 26 April 2023 in Bad Schandau near Dresden took place 17th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics.
An invited talk “Tortuosity and Porosity in Electrochemical Systems – Computed Tomography Based 3D Transport Modelling” was given by Prof. Robert Filipek who presented the newest achievements of the Modelling and Inverse Method Research Group.
55 participants from Europe, US and Asia share their expertise. During the conference 22 invited talks and 12 contributing posters were presented , and a podium discussion “Reliability of Automotive Electronics”.
